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ET
2002
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ET 2002
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Structural Fault Based Specification Reduction for Testing Analog Circuits
13 years 8 months ago
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sscas.ee.ncku.edu.tw
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...
Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen
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