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DFT
2004
IEEE
95views VLSI» more  DFT 2004»
14 years 2 months ago
Mixed Loopback BiST for RF Digital Transceivers
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
Jerzy Dabrowski, Javier Gonzalez Bayon
ATS
2000
IEEE
116views Hardware» more  ATS 2000»
14 years 3 months ago
An experimental analysis of spot defects in SRAMs: realistic fault models and tests
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
Said Hamdioui, A. J. van de Goor