MICRO
2010
IEEE
13 years 8 months ago
2010
IEEE
As technology scaling poses a threat to DRAM scaling due to physical limitations such as limited charge, alternative memory technologies including several emerging non-volatile me...
TCAD
2008
13 years 10 months ago
2008
Abstract--Simplifying a combinational circuit while preserving its range has a variety of applications, such as combinational equivalence checking and random simulation. Previous a...
DFT
2006
IEEE
14 years 23 days ago
2006
IEEE
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...