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ETS
2009
IEEE
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13 years 10 months ago
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
Michael A. Kochte, Christian G. Zoellin, Hans-Joac...