Sciweavers

EMNETS
2007
13 years 10 months ago
Increasing the reliability of wireless sensor networks with a distributed testing framework
Designing Wireless Sensor Networks (WSNs) has proven to be a slow, tedious and error-prone process due to the inherent intricacies of designing a distributed, wireless, and embedd...
Matthias Woehrle, Christian Plessl, Jan Beutel, Lo...
DAC
1999
ACM
13 years 11 months ago
Microprocessor Based Testing for Core-Based System on Chip
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC. The novel feature of the approach is the use an embedde...
Christos A. Papachristou, F. Martin, Mehrdad Noura...
VTS
2002
IEEE
107views Hardware» more  VTS 2002»
13 years 11 months ago
Testing High-Speed SoCs Using Low-Speed ATEs
We present a test methodology to allow testing high-speed circuits with low-speed ATEs. The basic strategy is adding an interface circuit to partially supply test data, coordinate...
Mehrdad Nourani, James Chin
ITC
2003
IEEE
127views Hardware» more  ITC 2003»
14 years 4 days ago
Testing of Droplet-Based Microelectrofluidic Systems
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
Fei Su, Sule Ozev, Krishnendu Chakrabarty
ITC
2003
IEEE
176views Hardware» more  ITC 2003»
14 years 4 days ago
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
Olivier Caty, Ismet Bayraktaroglu, Amitava Majumda...