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    ESD robustness of thin-film devices with different layout structures in LTPS technology
    13 years 11 months ago
    ESD robustness of thin-film devices with different layout structures in LTPS technology
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    The electrostatic discharge (ESD) robustness of different thin-film devices, including three diodes and two thin-film transistors (TFTs) in low-temperature polysilicon (LTPS) tech...
    Chih-Kang Deng, Ming-Dou Ker
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