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GLVLSI
2010
IEEE
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GLVLSI 2010
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Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS
13 years 10 months ago
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online.sfsu.edu
Transistor aging effects (NBTI and PBTI) impact the reliability of SRAM in nano-scale CMOS technologies. In this research, the combined effect of NBTI and PBTI on power gated SRAM...
Anuj Pushkarna, Hamid Mahmoodi
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