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VLSID
2002
IEEE
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14 years 12 months ago
Degree-of-Freedom Analysis for Sequential Machines Targeting BIST Quality and Gate Area
| This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some ac...
Samir Roy, Biplab K. Sikdar, Monalisa Mukherjee, D...