VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
Most verification tools and methodologies such as model checking, equivalence checking, hardware verification, software verification, and hardware-software coverification often fl...
VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
We propose a non-intrusive methodology for concurrent fault detection in FSMs. The proposed method is similar to duplication, wherein a replica of the circuit acts as a predictor ...
VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
In this paper, we provide an analytical framework to study the inter-cell and intra-cell bit-line coupling when it is superimposed with the ground bounce effect and show how those...
VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
Reducing leakage power and improving the reliability of data stored in the memory cells are both becoming challenging as technology scales down. While the smaller threshold voltag...
VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
This paper quantifies the performance of typical functional unit interface designs in single-chip systems. We introduce a specific equation to guide the design of optimal module i...
VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
The design of modern complex embedded systems require a high level of abstraction of the design. The SimnML[1] is a specification language to model processors for such designs. Se...
VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
In this paper we present statistical timing driven hMetisbased partitioning. We approach timing driven partitioning from a different perspective: we use the statistical timing cri...