VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
This paper employs general multivariate normal distribution to develop a new efficient statistical timing analysis methodology. The paper presents the theoretical framework of the...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
This paper presents two schemes for the implementation of high performance and low power FIR filtering Intellectual Property (IP) cores. Low power is achieved through the utilizat...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
Buffer insertion method plays a great role in modern VLSI design. Many buffer insertion algorithms have been proposed in recent years. However, most of them used simplified delay ...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
Low-Density Parity Check codes are a form of Error Correcting Codes used in various wireless communication applications and in disk drives. While LDPC codes are desirable due to t...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
One of the main challenges for design in the presence of process variations is to cope with the uncertainties in delay and leakage power. In this paper, the influence of leakage r...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
Timing margin (slack) needs to be carefully managed to ensure a satisfactory timing yield. We propose a new design flow that combines a false-path-aware gate sizing and a statisti...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
In this paper, we have studied and compared the RF performance metrics, unity gain frequency (ft) and Noise Figure (NF), of the devices with channel engineering consisting of halo...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
In this paper, we present a simple analytical equation for capturing phase errors in 3-stage ring oscillators. The model, based on a simple but useful idealization of the ring osc...
VLSID
2005
IEEE
15 years 2 months ago
2005
IEEE
This paper explores the recovery and rate capacity effect for batteries used in embedded systems. It describes the prominent battery models with their advantages and drawbacks. It...