VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
It is well-known that varying architectural, technological and implementation aspects of embedded microprocessors, such as ARM, can produce widely differing performance and power ...
VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
— Testing non volatile memories for tunnel oxide defects is one of the most important aspects to guarantee cell reliability. Defective tunnel oxide layer in core memory cells can...
VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
The last decade has seen a phenomenal increase in the use of electronic components in automotive systems, resulting in the replacement of purely mechanical or hydraulic-implementa...
VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
With the shift towards deep sub-micron (DSM) technologies, the increase in leakage power and the adoption of poweraware design methodologies have resulted in potentially significa...
VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
We present a lightweight scheme for watermarking or annotating video clips with information describing the workload that would be incurred while decoding the clip. This informatio...
VLSID
2008
IEEE
15 years 29 days ago
2008
IEEE
VLSID
2008
IEEE
15 years 29 days ago
2008
IEEE
Today's customizable processors allow the designer to augment the base processor with custom accelerators. By choosing appropriate set of accelerators, designer can significa...
VLSID
2008
IEEE
15 years 29 days ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
VLSID
2008
IEEE
15 years 29 days ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
VLSID
2008
IEEE
15 years 29 days ago
2008
IEEE
Protocol conversion involves the use of a converter to control communication between two or more protocols such that desired system-level specifications can be satisfied. We invest...