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    DATE
    2009
    IEEE
    93views Hardware» more  DATE 2009»
    Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
    14 years 7 months ago
    Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
    Download  eprints.ecs.soton.ac.uk
    Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
    S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
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