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    DAC
    2008
    ACM
    133views Computer Architecture» more  DAC 2008»
    Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
    15 years 14 days ago
    Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
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    The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
    Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
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