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ITC
2003
IEEE
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ITC 2003
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On Reducing Wrapper Boundary Register Cells in Modular SOC Testing
14 years 1 months ago
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www.itcprogramdev.org
Motivated by the increasing area and performance overhead caused by wrapping the embedded cores for modular SOC testing, this paper proposes a solution for reducing the number of ...
Qiang Xu, Nicola Nicolici
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