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23
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DATE
2010
IEEE
156
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DATE 2010
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Defect aware X-filling for low-power scan testing
13 years 10 months ago
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people.ee.duke.edu
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
S. Balatsouka, V. Tenentes, Xrysovalantis Kavousia...
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