DFT
1997
IEEE
13 years 11 months ago
1997
IEEE
Recent increases in the density and size of memory ICs made it ne cessary to search for new defect tolerance techniques since the traditional methods are no longer e ective enough...
FPL
2005
Springer
14 years 28 days ago
2005
Springer
This paper presents a revised model for the yield analysis of FPGA interconnect layers. Based on proven yield models, this work improves the predictions and assumptions of previous...