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DATE 2005
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An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories
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Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
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Added
24 Jun 2010
Updated
24 Jun 2010
Type
Conference
Year
2005
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DATE
Authors
Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
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Hardware Study Group
Computer Vision