: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make it suitable for the built-in-testing of critical RF blocks of a transceiver such as a Low Noise Amplifier (LNA) and Power amplifier (PA) without affecting their performance and with minimum area overhead. DESCRIPTION: The need to accelerate the time-to-market by providing a fast fault diagnosis during the product development phase and to reduce the cost of testing for high-volume manufacturing necessitates the development of efficient testing techniques for RF systems and components. Further, the characterization of the individual building blocks is desirable to detect parametric faults, improve the fault coverage and accelerate the product development phase. Towards this end, Built-in-Self-Test (BIST) techniques are very useful. This project tackles the challenge of designing a full-CMOS implementation of the...