VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise est...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
— A closed-form model for simulation and analysis of voltage transients caused by single-event upsets (SEUs) in logic circuits is described. A linear RC model, derived using a SP...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
TARO test patterns are transition fault test patterns that sensitize each transition fault to all of the outputs that can be reached from the fault location. We were not able to i...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in ...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
This paper describes a random jitter measurement technique using simple algorithms and comparator sampling. The approach facilitates using Automated Test Equipment (ATE) to valida...
VTS
2005
IEEE
14 years 6 months ago
2005
IEEE
† In digital radio applications, error-vector-magnitude (EVM) is the primary specification which quantifies the performance of digital modulation implemented in silicon. Producti...