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    Industrial experience with test generation languages for processor verification

    14 years 5 months ago
    Industrial experience with test generation languages for processor verification
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    Michael L. Behm, John M. Ludden, Yossi Lichtenstei
    claim paper
    Added 30 Jun 2010
    Updated 30 Jun 2010
    Type Conference
    Year 2004
    Where DAC
    Authors Michael L. Behm, John M. Ludden, Yossi Lichtenstein, Michal Rimon, Michael Vinov
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