A new state assignment technique for testing and low power

In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feedback cycles are reduced with minimal switching activity on the state variables. Experiment shows significant improvement in power dissipation and testabilities for benchmark circuits. Categories and Subject Descriptors B.8.1 [Performance and Reliability]: Reliability, Testing and Fault-Tolerance. J.6 [Computer-Aided Engineering]: Computer-aided design (CAD) General Terms Algorithm, Logic Synthesis, Design. Keywords State Encoding, Fault Coverage, Low power, Scan design.

• Type: Conference
• Year: 2004
• Where: DAC
• Authors: Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J. Ciesielski
• Keywords: Computer Architecture, DAC 2004, Minimal Switching Activity, Shows Significant Improvement, State Assignment Technique