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DATE
2003
IEEE

RF-BIST: Loopback Spectral Signature Analysis

14 years 4 months ago
RF-BIST: Loopback Spectral Signature Analysis
Built-In Self-Test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, Spectral Signature Analysis at system level seems to be a promising concept. Investigations that have been carried out are targeted on the most challenging problems: Generation of the Test Signature, Evaluation of the Signature Response, Implementation of the concept and Verification by Simulation. From investigations it can be concluded that the concept is suitable especially in the case of transceiver-type DUT.
Doris Lupea, Udo Pursche, Hans-Joachim Jentschel
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where DATE
Authors Doris Lupea, Udo Pursche, Hans-Joachim Jentschel
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