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ICCD
2003
IEEE

Aggressive Test Power Reduction Through Test Stimuli Transformation

14 years 4 months ago
Aggressive Test Power Reduction Through Test Stimuli Transformation
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain modification methodology that transforms the stimuli to be inserted to the scan chain through logic gate insertion between scan cells, reducing scan chain transitions. We introduce a novel matrix band algebra to formulate the impact of scan chain modifications on test stimuli transformations. Based on this analysis, we develop algorithms for transforming a set of test vectors into poweroptimal test stimuli through cost-effective scan chain modifications. Experimental results show that scan-in power reductions exceeding 90% for test vectors and 99.5% for test cubes can be attained by the proposed methodology.
Ozgur Sinanoglu, Alex Orailoglu
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ICCD
Authors Ozgur Sinanoglu, Alex Orailoglu
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