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ICCAD
2000
IEEE
171views Hardware» more  ICCAD 2000»
14 years 3 months ago
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
Michael Pronath, Volker Gloeckel, Helmut E. Graeb
ITC
2003
IEEE
214views Hardware» more  ITC 2003»
14 years 4 months ago
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
Harald P. E. Vranken, Friedrich Hapke, Soenke Rogg...
ICCD
2003
IEEE
143views Hardware» more  ICCD 2003»
14 years 4 months ago
Aggressive Test Power Reduction Through Test Stimuli Transformation
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
Ozgur Sinanoglu, Alex Orailoglu