Which concurrent error detection scheme to choose ?

Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some form of redundancy. Redundant systems are subject to common-mode failures (CMFs). While most of the studies of CED techniques focus on area overhead, few analyze the CMF vulnerability of these techniques. In this paper, for the first time, we present simulation results to quantitatively compare various CED schemes based on their area overhead and the protection (data integrity) they provide against multiple failures and CMFs. Our results indicate that, for the simulated combinational logic circuits, although diverse duplex systems (with two different implementations of the same logic function) sometimes have marginally higher area overhead, they provide significant protection against multiple failures and CMFs compared to other CED techniques like parity prediction.

• Type: Conference
• Year: 2000
• Where: ITC
• Authors: Subhasish Mitra, Edward J. McCluskey
• Keywords: Area Overhead, Hardware, ITC 2000, Multiple Failures, Various Ced Schemes