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27

ASPDAC
2000
ACM

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A non-scan DFT method at register-transfer level to achieve complete fault efficiency

14 years 3 months ago

A non-scan DFT method at register-transfer level to achieve complete fault efficiency

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Satoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa,

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Added	01 Aug 2010
Updated	01 Aug 2010
Type	Conference
Year	2000
Where	ASPDAC
Authors	Satoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara

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