4 search results - page 1 / 1 » A non-scan DFT method at register-transfer level to achieve ... |
ASPDAC
2000
ACM
13 years 11 months ago
2000
ACM
DFT
1999
IEEE
13 years 11 months ago
1999
IEEE
The inherent redundancy and in-the-field reconfiguration capabilities of field programmable gate arrays (FPGAs) provide alternatives to integrated circuit redundancy-based fault r...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...