On ILP Formulations for Built-In Self-Testable Data Path Synthesis

In this paper, we present a new method to the built-in selftestable data path synthesis based on integer linear programming (ILP). Our method performs system register assignment, built-in self-test (BIST) register assignment, and interconnection assignment concurrently to yield optimal designs. Our experimental results show that our method successfully synthesizes BIST circuits for all six circuits experimented. All the BIST circuits are better in area overhead than those generated by existing high-level BIST synthesis methods. Keywords high-level BIST synthesis, built-in self-test, BIST, ILP.

• Type: Conference
• Year: 1999
• Where: DAC
• Authors: Han Bin Kim, Dong Sam Ha, Takeshi Takahashi
• Keywords: BIST, BIST Circuits, BIST Synthesis Methods, Computer Architecture, DAC 1999