As society has become more reliant on electronics, the need for fault tolerant ICs has increased. This has resulted in signi cant research into both fault tolerant controller design, and mechanisms for datapath fault tolerance insertion. By treating these two issues separately, previous work has failed to address compatibility issues, as well as e cient codesign methodologies. In this paper, we present a uni ed approach to detecting control and datapath faults through the datapath, along with a method for fault identi cation and recon guration. By detecting control faults in the datapath, we avoid the area and performance overhead of detecting controlfaults through duplication orerror checking codes. The result is a complete design methodology for self recovering architectures capable of far more e cient solutions than previous approaches.