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ITC
1999
IEEE

Fault diagnosis in scan-based BIST using both time and space information

14 years 3 months ago
Fault diagnosis in scan-based BIST using both time and space information
Jayabrata Ghosh-Dastidar, Debaleena Das, Nur A. To
Added 04 Aug 2010
Updated 04 Aug 2010
Type Conference
Year 1999
Where ITC
Authors Jayabrata Ghosh-Dastidar, Debaleena Das, Nur A. Touba
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