Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper presents the results of the failure analysis portion of that project. The testing, reliability stressing, characterization, fault diagnosis and physical analysis results are presented for 25 devices including "IDDq-only" failures and "delay test-only" failures.

• Type: Conference
• Year: 1999
• Where: ITC
• Authors: Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato Forlenza, Ray Kurtulik, Wendy Chong
• Keywords: Common Test Methodologies, Failure Analysis Portion, Hardware, ITC 1999, Test Method Evaluation