EDCC
1999
Springer
14 years 4 months ago
1999
Springer
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
DATE
1999
IEEE
14 years 4 months ago
1999
IEEE
The paper introduces the new concept of symmetric transparent BIST for RAMs. This concept allows to skip the signature prediction phase of conventional transparent BIST approaches...
VLSID
2001
IEEE
15 years 26 days ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...