Measuring the Vulnerability of Interconnection Networks in Embedded Systems

Studies of the fault-tolerance of graphs have tended to largely concentrate on classical graph connectivity. This measure is very basic, and conveys very little information for designers to use in selecting a suitable topology for the interconnection network in embedded systems. In this paper, we study the vulnerability of interconnection networks to the failure of individual links, using a set of four measures which, taken together, provide a much fuller characterization of the network. Moreover, while traditional studies typically limit themselves to uncorrelated link failures, our model deals with both uncorrelated and correlated failure modes. This is of practical signi cance, since quite often, failures in networks are correlated due to physical considerations.

• Type: Conference
• Year: 1998
• Where: IPPS
• Authors: Vijay Lakamraju, Zahava Koren, Israel Koren, C. Mani Krishna
• Keywords: Classical Graph Connectivity, Correlated Failure Modes, Distributed And Parallel Computing, Interconnection Networks, IPPS 1998