On applying non-classical defect models to automated diagnosis

Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis technique to a TI ASIC design. Results are presented for units into which known bridging defects have been introduced via a focused ion beam (FIB) machine.

• Type: Conference
• Year: 1998
• Where: ITC
• Authors: Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess
• Keywords: Fault Based Diagnosis, Fault Diagnosis, Hardware, ITC 1998, Stuckat Fault Model