Native mode functional test generation for processors with applications to self test and design validation

New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. We present a versatile automatic functional test generation methodology for microprocessors. The generated assembly instruction sequences can be applied to both design validation and manufacturing test, especially in high speed native" mode. All the functional capabilities of complex processors can be exercised, leading to high quality validation sequences and manufacturing tests with high fault coverage. The tests can also be applied in a built-in self-test fashion. Experimental results on two microprocessorsshow that this method is verye ective in generatinghigh quality manufacturing tests as well as in functional design validation.

• Type: Conference
• Year: 1998
• Where: ITC
• Authors: Jian Shen, Jacob A. Abraham
• Keywords: Built-in Self-test, Design Validation, Hardware, ITC 1998, Manufacturing Tests