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ITC
1998
IEEE
1998
IEEE
An almost full-scan BIST solution-higher fault coverage and shorter test application time
Real-time Traffic| Added | 05 Aug 2010 |
| Updated | 05 Aug 2010 |
| Type | Conference |
| Year | 1998 |
| Where | ITC |
| Authors | Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng |
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