A methodology for hierarchicalstatistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented. The methodology uses principalcomponentanalysis, response surface methodology, and statistics to directly calculate the statistical distributions of higher-level parameters from the distributions of lower-level parameters. We have used the methodology to characterizea folded cascodeoperational amplifier and a phase-locked loop. This methodology permits the statistical characterization of large analog and mixed-signal systems, many of which are extremely time-consuming or impossible to characterize using existing methods.