Abstract-- Process scaling and higher leakage power have resulted in increased power densities and elevated die temperatures. Due to the interdependence of temperature and leakage power, we observe that the floorplan has an impact on both the temperatures and the leakage of the IP-blocks in a system on chip (SoC). Hence, in this paper we propose a novel system level Leakage Aware Floorplanner (LEAF) which optimizes floorplans for temperature-aware leakage power along with the traditional metrics of area and wire length. Our floorplanner takes a SoC netlist and the dynamic power profile of functional blocks to determine a placement while optimizing for temperature dependent leakage power, area, and wire length. To demonstrate the effectiveness of LEAF, we implemented our methodology on ten industrial SoC designs from Freescale Semiconductor Inc. and evaluated the trade-off between leakage power and area. We observed up to 190% difference in the leakage power between leakage-unaware and ...
Aseem Gupta, Nikil D. Dutt, Fadi J. Kurdahi, Kamal