This paper presents a new on-chip time measurement architecture which is based on the Timeto-Digital Conversion (TDC) method that is capable of achieving a timing resolution of tens of femtoseconds without the use of external automatic test equipment (ATE). This is the highest temporal resolution that has been reported to-date and is achieved by the use of the homodyne technique. The proposed architecture has been designed using a 0.12
Matthew Collins, Bashir M. Al-Hashimi