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    Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices

    15 years 16 days ago
    Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices
    Download  cadlab.ece.ucsb.edu
    Yi-Min Jiang, Kwang-Ting Cheng
    claim paper
    Added 13 Nov 2009
    Updated 13 Nov 2009
    Type Conference
    Year 1999
    Where DAC
    Authors Yi-Min Jiang, Kwang-Ting Cheng
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