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34

DAC
1999
ACM

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Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme

15 years 13 days ago

Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme

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Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik

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DAC 1999 | Design Automation | Test Application Scheme |

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Added	13 Nov 2009
Updated	13 Nov 2009
Type	Conference
Year	1999
Where	DAC
Authors	Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik

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