DAC
2006
ACM
14 years 2 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
DAC
2006
ACM
14 years 2 months ago
2006
ACM
With the growing complexity in consumer embedded products and the improvements in process technology, Multi-Processor SystemOn-Chip (MPSoC) architectures have become widespread. T...
DAC
2006
ACM
14 years 4 months ago
2006
ACM
Security and reliability in processor based systems are concerns requiring adroit solutions. Security is often compromised by code injection attacks, jeopardizing even `trusted so...
DAC
2006
ACM
14 years 4 months ago
2006
ACM
Statistical static timing analysis (SSTA) has been a popular research topic in recent years. A fundamental issue with applying SSTA in practice today is the lack of reliable and e...
DAC
2006
ACM
14 years 4 months ago
2006
ACM
Conventionally, signal net routing is almost always implemented as Steiner trees. However, non-tree topology is often superior on timing performance as well as tolerance to open f...
DAC
2006
ACM
2006
ACM
A fast on-chip decoupling capacitance budgeting algorithm using macromodeling and linear programming
14 years 6 months ago
We propose a novel and efficient charge-based decoupling capacitance budgeting algorithm. Our method uses the macromodeling technique and effective radius of decoupling capacitan...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
This article describes a new software-based on-line memory compression algorithm for embedded systems and presents a method of adaptively managing the uncompressed and compressed ...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
DAC
2006
ACM
14 years 6 months ago
2006
ACM
We present a new method for mathematically estimating the active unit power of functional units in modern microprocessors such as the Pentium 4 family. Our method leverages the ph...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...