Probabilistic Analysis of Probe Reliability in Differential Gene Expression Studies with Short Oligonucleotide Arrays

— Probe defects are a major source of noise in gene expression studies. While existing approaches detect noisy probes based on external information such as genomic alignments, we introduce and validate a targeted probabilistic method for analyzing probe reliability directly from expression data and independently of the noise source. This provides insights into the various sources of probe-level noise and gives tools to guide probe design.

• Type: Journal
• Year: 2011
• Where: TCBB
• Authors: Leo Lahti, Laura Elo, Tero Aittokallio, Samuel Kaski
• Keywords: Gene Expression Studies, Probe Reliability, Software Engineering, Targeted Probabilistic Method, TCBB 2011