Accurate Diagnosis of Multiple Faults

In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective signals which can jointly explain the circuit’s faulty behavior. This method can be applied after any existing state-of-the-art diagnosis process to further improve the diagnosis resolution. The proposed diagnosis method generates limited-cycle sequential tests for SAT-based diagnosis which results in significantly higher diagnosis accuracy for multiple faults. The experimental results demonstrate the effectiveness of the proposed method.

• Type: Conference
• Year: 2005
• Where: ICCD
• Authors: Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
• Keywords: Diagnosis Method, Hardware, ICCD 2005, Sequential Sat-based Diagnosis, State-of-the-art Diagnosis Process