DATE
1999
IEEE
14 years 5 months ago
1999
IEEE
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
ICCD
2005
IEEE
14 years 9 months ago
2005
IEEE
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...