126
Voted
DATE
1999
IEEE
15 years 7 months ago
1999
IEEE
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
106
Voted
ICCD
2005
IEEE
16 years 14 days ago
2005
IEEE
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...