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12

DATE
2008
IEEE

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Analysis of The Test Data Volume Reduction Benefit of Modular SOC Testing

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Analysis of The Test Data Volume Reduction Benefit of Modular SOC Testing

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Ozgur Sinanoglu, Erik Jan Marinissen

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Added	29 May 2010
Updated	29 May 2010
Type	Conference
Year	2008
Where	DATE
Authors	Ozgur Sinanoglu, Erik Jan Marinissen

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