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    A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology

    14 years 6 months ago
    A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology
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    Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol
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    Added 04 Jun 2010
    Updated 04 Jun 2010
    Type Conference
    Year 2007
    Where ISQED
    Authors Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski
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