Sciweavers

Free Online Productivity Tools i2Speak i2Symbol i2OCR iTex2Img iWeb2Print iWeb2Shot i2Type iPdf2Split iPdf2Merge i2Bopomofo i2Arabic i2Style i2Image i2PDF iLatex2Rtf Sci2ools

20

ISQED
2007
IEEE

favoriteEmaildiscussreport

136views Hardware» more ISQED 2007»

A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology

14 years 5 months ago

A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology

Download www.cs.pitt.edu

Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol

Real-time Traffic

Hardware | ISQED 2007 |

claim paper

Related Content

» Statistical Framework for TechnologyModelProduct CoDesign and Convergence

» A factor model to analyze heterogeneity in gene expression

Post Info
More Details (n/a)

Added	04 Jun 2010
Updated	04 Jun 2010
Type	Conference
Year	2007
Where	ISQED
Authors	Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski

Comments (0)