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ISQED
2007
IEEE
179views Hardware» more  ISQED 2007»
14 years 6 months ago
Cross Layer Error Exploitation for Aggressive Voltage Scaling
This paper shows that by co-designing circuits and systems, considerable power savings are possible if the inherent data redundancy of candidate systems such as wireless is used t...
Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Ku...
ISQED
2007
IEEE
254views Hardware» more  ISQED 2007»
14 years 6 months ago
An Aggregation-Based Algebraic Multigrid Method for Power Grid Analysis
ct This paper develops an aggregation-based algebraic multigrid (AbAMG) method to efficiently analyze the power grids. Different from the conventional algebraic multigrid (AMG) sc...
Pei-Yu Huang, Huan-Yu Chou, Yu-Min Lee
ISQED
2007
IEEE
151views Hardware» more  ISQED 2007»
14 years 6 months ago
Wavelet-Based Passivity Preserving Model Order Reduction for Wideband Interconnect Characterization
Model order reduction plays a key role in determining VLSI system performance and the optimization of interconnects. In this paper, we develop an accurate and provably passive met...
Mehboob Alam, Arthur Nieuwoudt, Yehia Massoud
ISQED
2007
IEEE
120views Hardware» more  ISQED 2007»
14 years 6 months ago
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
Nigel Drego, Anantha Chandrakasan, Duane S. Boning
ISQED
2007
IEEE
182views Hardware» more  ISQED 2007»
14 years 6 months ago
Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below
Historically, design margin and defects have been viewed as different topics, one part of design and the other part of test. Shrinking process geometries are making the two part o...
Robert C. Aitken
ISQED
2007
IEEE
187views Hardware» more  ISQED 2007»
14 years 6 months ago
High-Frequency-Measurement-Based Frequency-Variant Transmission Line Characterization and Circuit Modeling for Accurate Signal I
Novel experimental characterization method and circuit modeling for frequency-variant transmission lines are presented. Experimental test patterns are designed and fabricated by u...
Hyunsik Kim, Yungseon Eo
ISQED
2007
IEEE
236views Hardware» more  ISQED 2007»
14 years 6 months ago
3DFFT: Thermal Analysis of Non-Homogeneous IC Using 3D FFT Green Function Method
Due to the roaring power dissipation and gaining popularity of 3D integration, thermal dissipation has been a critical concern of modern VLSI design. The availability for chip-lev...
Dongkeun Oh, Charlie Chung-Ping Chen, Yu Hen Hu
ISQED
2007
IEEE
104views Hardware» more  ISQED 2007»
14 years 6 months ago
System Level Estimation of Interconnect Length in the Presence of IP Blocks
With the increasing size and sophistication of circuits and specifically in the presence of IP blocks, new wirelength estimation methods are needed in the design flow of large-sca...
Taraneh Taghavi, Ani Nahapetian, Majid Sarrafzadeh
ISQED
2007
IEEE
203views Hardware» more  ISQED 2007»
14 years 6 months ago
Future Prediction of Self-Heating in Short Intra-Block Wires
This paper predicts self-heating effect in a short intrablock wire will arise as a design issue with technology scaling. The short intra-block wires are close to the substrate an...
Kenichi Shinkai, Masanori Hashimoto, Takao Onoye
ISQED
2007
IEEE
140views Hardware» more  ISQED 2007»
14 years 6 months ago
Leakage-Conscious Architecture-Level Power Estimation for Partitioned and Power-Gated SRAM Arrays
We propose a methodology and power models for an accurate high-level power estimation of physically partitioned and power-gated SRAM arrays. The models offer accurate estimation o...
Minh Quang Do, Mindaugas Drazdziulis, Per Larsson-...