On capture power-aware test data compression for scan-based testing

Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the “don’t-care” bits can be exploited for test data compression and/or test power reduction. Prior work either targets only one of these two issues or considers to reduce test data volume and scan shift power together. In this paper, we propose a novel capture power-aware test compression scheme that is able to keep scan capture power under a safe limit with little loss in test compression ratio. Experimental results on benchmark circuits demonstrate the efficacy of the proposed approach.

• Type: Conference
• Year: 2008
• Where: ICCAD
• Authors: Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu
• Keywords: Hardware, ICCAD 2008, Test Compression Ratio, Test Data Compression, Test Data Volume