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    An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories

    14 years 5 months ago
    An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories
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    Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
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    Added 24 Jun 2010
    Updated 24 Jun 2010
    Type Conference
    Year 2005
    Where DATE
    Authors Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
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